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Hot-Carrier Reliability of Mos VLSI Circuits: 227 (The Springer International Series in Engineering and Computer Science) Hot-Carrier Reliability of Mos VLSI Circuits: 227 (The Springer International Series in Engineering and Computer Science) by Yusuf Leblebici,Sung-Mo Kang,(Steve) Kang Sung-Mo (Steve) Kang

Hot-Carrier Reliability of Mos VLSI Circuits: 227 (The Springer International Series in Engineering and Computer Science)

by Yusuf Leblebici,Sung-Mo Kang,(Steve) Kang Sung-Mo (Steve) Kang


ISBN 13: 9780792393528

Format: Illustrated (236 pages)
Publisher: Springer
Published: 30 Jun 1993

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